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Illumination Recovery For Optical Microscopy

Abstract Details

2020, Master of Science (M.S.), University of Dayton, Electrical Engineering.
We propose a novel solution to the correction of illumination non-uniformity without removing the imaging sample. Calibration of the spatial illumination pattern in microscopy is challenging due to the fact that the illumination source is colocated with the objective lens and therefore cannot be observed directly. Our proposed methodology overcomes this by collecting three spatially translated images in a strategic way. We prove that ``log-illumination pattern'' recovery can be reformulated as a deconvolution of log-ratio of captured images, and develop an efficient, noise-robust implementation. Experiments with simulated and reflectance microscopy data verifies the effectiveness of our proposed approach.
Keigo Hirakawa, PhD (Advisor)
Bradley Ratliff, PhD (Committee Member)
Michael Uchic, PhD (Committee Member)
30 p.

Recommended Citations

Citations

  • Brookshire, C. T. (2020). Illumination Recovery For Optical Microscopy [Master's thesis, University of Dayton]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=dayton1588936914060945

    APA Style (7th edition)

  • Brookshire, Charles. Illumination Recovery For Optical Microscopy . 2020. University of Dayton, Master's thesis. OhioLINK Electronic Theses and Dissertations Center, http://rave.ohiolink.edu/etdc/view?acc_num=dayton1588936914060945.

    MLA Style (8th edition)

  • Brookshire, Charles. "Illumination Recovery For Optical Microscopy ." Master's thesis, University of Dayton, 2020. http://rave.ohiolink.edu/etdc/view?acc_num=dayton1588936914060945

    Chicago Manual of Style (17th edition)