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Structural Mapping of Paper Towels: Comparison of Twin Laser Profilometry and Synchrotron X-ray Micro-computed Tomography

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2010, Master of Science, Miami University, Paper Science and Engineering.
This investigation was to compare the structural properties, of commercial available single ply paper towels, as they vary in X-Y plane. The focus was to quantify the differences in selected regions of interest, as measured by two analytical methods, non-contact Twin Laser Profilometry (TLP) and synchrotron X-ray micro-computed tomography (XRμCT). The thickness and out-of-plane deformation (OPD) distributions were mapped using a TLP and XRμCT. The XRμCT samples were further used to calculate for the mass center surface. TLP enables web structures to be mapped to a micrometer resolution over 12.5mm regions. Synchrotron X-ray microtomography method provides sub-micrometer resolution of the complete volumetric structure (1.4mm x 1.4mm x thickness (μm)) for the imaged region. The features of individual fibers are revealed by XRμCT method, so that the true surface geometry may be quantified.
D. Steven Keller, PhD (Advisor)
Douglas W. Coffin, PhD (Committee Member)
Shashi Lalvani, PhD (Committee Member)
96 p.

Recommended Citations

Citations

  • Huang, Y. (2010). Structural Mapping of Paper Towels: Comparison of Twin Laser Profilometry and Synchrotron X-ray Micro-computed Tomography [Master's thesis, Miami University]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=miami1281751951

    APA Style (7th edition)

  • Huang, Yan. Structural Mapping of Paper Towels: Comparison of Twin Laser Profilometry and Synchrotron X-ray Micro-computed Tomography. 2010. Miami University, Master's thesis. OhioLINK Electronic Theses and Dissertations Center, http://rave.ohiolink.edu/etdc/view?acc_num=miami1281751951.

    MLA Style (8th edition)

  • Huang, Yan. "Structural Mapping of Paper Towels: Comparison of Twin Laser Profilometry and Synchrotron X-ray Micro-computed Tomography." Master's thesis, Miami University, 2010. http://rave.ohiolink.edu/etdc/view?acc_num=miami1281751951

    Chicago Manual of Style (17th edition)