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Investigation of Interface Diffusion on the Reliability of AlGaN/GaN High Electron Mobility Transistor by Thermodynamic Modeling

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2012, Master of Science, Miami University, Chemical, Paper and Biomedical Engineering.
Gallium nitride semiconductors are of great interest as high power/temperature transistors due to their wide band gaps and high electron mobility. However, AlGaN/GaN transistors have shown device instability at higher temperatures. In this thesis, Thermo Calc© and DICTRA© software were used to investigate the defect chemistry of the Al-Ga-N material system and the diffusion kinetics of nickel into the AlGaN layer of the device by the Computer Coupling of Phase Diagrams and Thermochemistry methodology. Using this methodology, both a thermodynamic and kinetic database need to be developed. A Ga-N thermodynamic database was first built and the phase diagram and defect concentration were calculated to ensure its accuracy in diffusion simulations. The kinetic simulation results indicated temperature activated diffusion of nickel as a possible mechanism for device failure.
Lei Kerr, PhD (Advisor)
Doug Coffin, PhD (Committee Member)
Shashi Lalvani, PhD (Committee Member)
65 p.

Recommended Citations

Citations

  • Ucci, R. (2012). Investigation of Interface Diffusion on the Reliability of AlGaN/GaN High Electron Mobility Transistor by Thermodynamic Modeling [Master's thesis, Miami University]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=miami1344529070

    APA Style (7th edition)

  • Ucci, Russell. Investigation of Interface Diffusion on the Reliability of AlGaN/GaN High Electron Mobility Transistor by Thermodynamic Modeling. 2012. Miami University, Master's thesis. OhioLINK Electronic Theses and Dissertations Center, http://rave.ohiolink.edu/etdc/view?acc_num=miami1344529070.

    MLA Style (8th edition)

  • Ucci, Russell. "Investigation of Interface Diffusion on the Reliability of AlGaN/GaN High Electron Mobility Transistor by Thermodynamic Modeling." Master's thesis, Miami University, 2012. http://rave.ohiolink.edu/etdc/view?acc_num=miami1344529070

    Chicago Manual of Style (17th edition)