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CONDUCTED EMISSION STUDY ON SI AND SIC POWER DEVICES

Abstract Details

2019, Master of Science, Miami University, Computational Science and Engineering.
The trend towards more electric vehicles has pushed Silicon (Si) devices to its limits. To expand the performance limits of Si devices, Silicon Carbide (SiC) devices are marketed to have a lower power loss, smaller packaging at a higher voltage, and stable performance under high junction temperature. The performance advantage provided by SiC devices greatly exceed Si devices. To smoothly transition to SiC devices, the conducted emission must be investigated. The aim of this thesis is to compare the conducted emission profile of Si and SiC devices in a Three-Phase Inverter (TPI). For this study, one Si IGBT and three SiC devices are selected. First, the device voltage switching speeds and switching energy at 540 V are evaluated through Double Pulse Testing with two variables: switching current and device temperature. The results confirm that SiC has a higher switching speed and lower switching loss. In addition, the temperature effects on SiC devices are less severe than Si devices. Second, the effects of individual parasitics in a TPI are simulated and modeled. Finally, the conducted emission results are acquired for the four devices at 540 V and 4 kW.
Mark Scott (Advisor)
Donald Ucci (Committee Member)
Cong Li (Committee Member)
136 p.

Recommended Citations

Citations

  • Guo, W. (2019). CONDUCTED EMISSION STUDY ON SI AND SIC POWER DEVICES [Master's thesis, Miami University]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=miami1557701342593551

    APA Style (7th edition)

  • Guo, Wilson. CONDUCTED EMISSION STUDY ON SI AND SIC POWER DEVICES. 2019. Miami University, Master's thesis. OhioLINK Electronic Theses and Dissertations Center, http://rave.ohiolink.edu/etdc/view?acc_num=miami1557701342593551.

    MLA Style (8th edition)

  • Guo, Wilson. "CONDUCTED EMISSION STUDY ON SI AND SIC POWER DEVICES." Master's thesis, Miami University, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=miami1557701342593551

    Chicago Manual of Style (17th edition)