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Development and Testing of the Experimental Setup for Characterization of Semiconductors Using Reflectance Spectroscopy

Ramani, Jayanth
http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1303263227

Abstract Details

2011, Master of Science (MS), Ohio University, Electrical Engineering (Engineering and Technology).
The last decade has seen the semiconductor industry achieve giant leaps. The III-V semiconductors including the III-nitride materials have turned out to be one of the most exciting semiconductor compounds for the realization of modern day optoelectronic devices. Prior to using these semiconductors in the realization of optoelectronic devices it is necessary to characterize them for their structural, electrical and optical properties. Reflectance spectroscopy is one of the most reliable and accurate semiconductor characterization technique which could be used for both thin films and bulk semiconductors in quest for gaining knowledge about materials opto-electrical parameters. The ability to produce sharp features indirectly representing semiconductor physical parameters like band gap, broadening parameter, defect levels etc. at given temperature is one of greatest advantage of this technique. Here, we study the reflected light from the specimen rather than the luminescence. The thesis presented will review this in detail along with the description of the experimental setup developed for the purpose of studying III-V and RE doped III-nitride semiconductors using photoreflectance spectroscopy. Furthermore, selected experimental results obtained for GaAs and GaN doped with Tb3+ demonstrate increased sensitivity of the double modulation photoreflectance spectroscopy as compared to single modulation photoreflectance spectroscopy when conducted at room temperature. The thesis presented will review this in details.
Jadwisienczak Wojciech (Advisor)
Savas Kaya (Committee Member)
Avinash Kodi (Committee Member)
Eric Stinaff (Committee Member)
74 p.
Materials Science; Physics
reflectance spectroscopy; semiconductor charaterisation; III-V semiconductors; photoreflectance spectroscopy

Recommended Citations

Citations

  • Ramani, J. (2011). Development and Testing of the Experimental Setup for Characterization of Semiconductors Using Reflectance Spectroscopy [Master's thesis, Ohio University]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1303263227

    APA Style (7th edition)

  • Ramani, Jayanth. Development and Testing of the Experimental Setup for Characterization of Semiconductors Using Reflectance Spectroscopy. 2011. Ohio University, Master's thesis. OhioLINK Electronic Theses and Dissertations Center, http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1303263227.

    MLA Style (8th edition)

  • Ramani, Jayanth. "Development and Testing of the Experimental Setup for Characterization of Semiconductors Using Reflectance Spectroscopy." Master's thesis, Ohio University, 2011. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1303263227

    Chicago Manual of Style (17th edition)

ohiou1303263227
723
© 2011, all rights reserved.
This open access ETD is published by Ohio University and OhioLINK.