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EMI/EMC analysis of electronic systems subject to near zone illuminations

Khan, Zulfiqar A
http://rave.ohiolink.edu/etdc/view?acc_num=osu1196207323

Abstract Details

2007, Doctor of Philosophy, Ohio State University, Electrical Engineering.
There is an increasing interest to evaluate performance of electronic systems subject to electromagnetic interference (EMI). To this end, an efficient technique for system level EMI/EMC analysis of electronic systems was recently proposed. This scheme, referred to as the hybrid S-matrix method, is based on introducing an additional port on the printed circuit board (PCB) and cable network to represent the plane wave excitation. The scattering matrix for the network (with the added port) is generated once the transmission line (TL) modes are extracted from the induced voltages. The resulting hybrid S-matrix allows for complete characterization of a microwave network in presence of enclosures or other scatterers. It can then be ported into a circuit solver for complex EMI/EMC analysis of electronic devices. This dissertation extends the hybrid S-matrix approach to near zone sources. A key aspect of this generalization is the use of the FFT rather than the GPOF to identify the TL modes in presence of the continuous spectrum of forced modes introduced by the near zone sources. Examples are shown to validate the generalized hybrid S-matrix method. These include a multi-layered PCB in the presence of nearby cables and when enclosed by the metallic structures with openings. The final chapter of the dissertation contains numerous experimental examples that provide for the first time a set of realistic EMI/EMC reference data. Specifically, field penetration through apertures and coupling of penetrating wires onto the printed circuit boards (PCBs) enclosed by resonant structures are considered. In contrast to other measurements, we focus on multi-cavity enclosures in presence of cables and PCBs. The purpose of this experimental study is to provide accurate reference data for possible future validation of various computational tools and to test their accuracy and efficiency on realistic platforms. In particular, we validate the proposed hybrid S-matrix method.
John Volakis (Advisor)
Electromagnetic Compatibility (EMC); Electromagnetic Interference (EMI); S-parameters; Measurements

Recommended Citations

Citations

  • Khan, Z. A. (2007). EMI/EMC analysis of electronic systems subject to near zone illuminations [Doctoral dissertation, Ohio State University]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=osu1196207323

    APA Style (7th edition)

  • Khan, Zulfiqar. EMI/EMC analysis of electronic systems subject to near zone illuminations. 2007. Ohio State University, Doctoral dissertation. OhioLINK Electronic Theses and Dissertations Center, http://rave.ohiolink.edu/etdc/view?acc_num=osu1196207323.

    MLA Style (8th edition)

  • Khan, Zulfiqar. "EMI/EMC analysis of electronic systems subject to near zone illuminations." Doctoral dissertation, Ohio State University, 2007. http://rave.ohiolink.edu/etdc/view?acc_num=osu1196207323

    Chicago Manual of Style (17th edition)

osu1196207323
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© 2007, all rights reserved.
This open access ETD is published by The Ohio State University and OhioLINK.