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Novel High-k Dielectric Enhanced III-Nitride Devices

Hung, Ting-Hsiang

Abstract Details

2015, Doctor of Philosophy, Ohio State University, Electrical and Computer Engineering.
This dissertation describes the design, fabrication and characterization of high-k dielectric enhanced Gallium Nitride (GaN)-based devices. Interface properties of atomic layer deposited (ALD) Aluminum Oxide (Al2O3) on GaN was initially investigated. The conduction band offset of Al2O3/GaN was experimentally found as 2.1 eV. High density of positive interface fixed charge (2.72x1013 cm-2) was observed in the Al2O3/GaN. These interface fixed charges can not only induce electrical field in the oxide which increases the reverse gate leakage, but shift the threshold voltage toward negative to prevent E-mode operation. A theoretical study using remote impurity scattering along with other scattering models showed that these interface fixed charges are able to degrade the electron mobility in the channel.
Siddharth Rajan (Advisor)
Steven Ringel (Committee Member)
Aaron Arehart (Committee Member)
159 p.

Recommended Citations

Citations

  • Hung, T.-H. (2015). Novel High-k Dielectric Enhanced III-Nitride Devices [Doctoral dissertation, Ohio State University]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=osu1437684419

    APA Style (7th edition)

  • Hung, Ting-Hsiang. Novel High-k Dielectric Enhanced III-Nitride Devices. 2015. Ohio State University, Doctoral dissertation. OhioLINK Electronic Theses and Dissertations Center, http://rave.ohiolink.edu/etdc/view?acc_num=osu1437684419.

    MLA Style (8th edition)

  • Hung, Ting-Hsiang. "Novel High-k Dielectric Enhanced III-Nitride Devices." Doctoral dissertation, Ohio State University, 2015. http://rave.ohiolink.edu/etdc/view?acc_num=osu1437684419

    Chicago Manual of Style (17th edition)