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Dissertation draft JDeitz Final.pdf (7.79 MB)

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Bridging the Gap: Probing Structure-Property Relationships in Functional Materials through Advanced Electron Microscopy Based Characterization

Deitz, Julia
http://rave.ohiolink.edu/etdc/view?acc_num=osu1543506730719345

Abstract Details

2018, Doctor of Philosophy, Ohio State University, Materials Science and Engineering.
The ultimate performance of functional materials and devices is critically dependent on micro-to-nanoscale features in related material systems. Structural defects, for example, such as stacking faults and misfit dislocations can hinder device (photovoltaics (PV), light emitting diodes, sensors etc.) efficiency significantly, but the exact mechanisms behind such behaviors remain elusive. Given this dependency, it is of utmost importance to study such features to understand their final role in device efficiency and to better understand the growth conditions that promote their existence. Electron microscopy is one of the few tools able to probe materials systems, both with respect to structure and properties, on these small length scales. The work presented here covers the detailed characterization and analysis of functional materials and structures, with primary focus on PV materials, using two techniques: (1) electron channeling contrast imaging (ECCI) for the rapid structural characterization of subsurface defects and features and (2) electron energy-loss spectroscopy (EELS) for the electronic characterization of various interfaces, chemical inhomogeneities, and structural defects of significance. ECCI work will highlight three new characterization applications of the technique: interfacial characterization, subsurface quantum dots, and chemical inhomogeneities. Additionally ECCI performed with scanning deep-level transient spectroscopy is demonstrated to show correlation between trap states and structural defects. EELS results will include the development of a new, robust method for nanoscale bandgap profiling and the novel demonstration of spatial- and energy-resolved EELS-based detection and characterization of sub-gap defect states. The objective of this research is the elucidation of the fundamental structure-property relationships within these materials systems, providing vital feedback into ongoing and future materials and device design, synthesis, and test efforts.
Tyler Grassman (Advisor)
David McComb (Advisor)
Maryam Ghazisaeidi (Committee Member)
Stephen Niezgoda (Committee Member)
202 p.
Materials Science
Electron microscopy, photovoltaics, functional materials, electron energy-loss spectroscopy, electron channeling contrast imaging

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Citations

  • Deitz, J. (2018). Bridging the Gap: Probing Structure-Property Relationships in Functional Materials through Advanced Electron Microscopy Based Characterization [Doctoral dissertation, Ohio State University]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=osu1543506730719345

    APA Style (7th edition)

  • Deitz, Julia. Bridging the Gap: Probing Structure-Property Relationships in Functional Materials through Advanced Electron Microscopy Based Characterization. 2018. Ohio State University, Doctoral dissertation. OhioLINK Electronic Theses and Dissertations Center, http://rave.ohiolink.edu/etdc/view?acc_num=osu1543506730719345.

    MLA Style (8th edition)

  • Deitz, Julia. "Bridging the Gap: Probing Structure-Property Relationships in Functional Materials through Advanced Electron Microscopy Based Characterization." Doctoral dissertation, Ohio State University, 2018. http://rave.ohiolink.edu/etdc/view?acc_num=osu1543506730719345

    Chicago Manual of Style (17th edition)

osu1543506730719345
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This open access ETD is published by The Ohio State University and OhioLINK.