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POWER VARIATIONS AND TEST SCHEDULING FOR EMBEDDED MEMORY ARRAYS

ZHOU, YUAN
http://rave.ohiolink.edu/etdc/view?acc_num=ucin1140810178

Abstract Details

2006, MS, University of Cincinnati, Engineering : Computer Engineering.
Embedded memories have played an important role in Integrated Circuits (ICs). Managing its power and test strategy have become two of the major constraints in System-on-a-Chip (SoC) designs. With the shrinkage of feature size in ICs, the uncertainty of the power consumption increases, and this is caused by process and environmental variations. In this work, we simulate the power variation of a predictive 32nm SRAM due to process and environmental variations, and match them to normal distributions. With this inherent uncertainty in mind, we develop a power-constrained test scheduling algorithm for embedded memories in a SoC. This algorithm takes advantages of the probability distribution, and can reach better results than the pessimistic way which used the worst-case power consumption. To realize this algorithm, we also modify the embedded memory test architecture by adding a dynamic scheduling ability. Hardware support for the dynamic scheduling method is also presented in this thesis.
Dr. Wen-Ben Jone (Advisor)
84 p.

Recommended Citations

Citations

  • ZHOU, Y. (2006). POWER VARIATIONS AND TEST SCHEDULING FOR EMBEDDED MEMORY ARRAYS [Master's thesis, University of Cincinnati]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1140810178

    APA Style (7th edition)

  • ZHOU, YUAN. POWER VARIATIONS AND TEST SCHEDULING FOR EMBEDDED MEMORY ARRAYS. 2006. University of Cincinnati, Master's thesis. OhioLINK Electronic Theses and Dissertations Center, http://rave.ohiolink.edu/etdc/view?acc_num=ucin1140810178.

    MLA Style (8th edition)

  • ZHOU, YUAN. "POWER VARIATIONS AND TEST SCHEDULING FOR EMBEDDED MEMORY ARRAYS." Master's thesis, University of Cincinnati, 2006. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1140810178

    Chicago Manual of Style (17th edition)

ucin1140810178
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© 2006, all rights reserved.
This open access ETD is published by University of Cincinnati and OhioLINK.