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AFM-FTIR: A New Technique for Materials Characterization

Starr, Michael J.
http://rave.ohiolink.edu/etdc/view?acc_num=ucin1227192819

Abstract Details

2008, MS, University of Cincinnati, Engineering : Materials Science.
A new type of infrared spectroscopy for obtaining the molecular composition of the surfaces of materials has been developed by combining the inherently high spatial resolution of the atomic force microscope (AFM) with the powerful chemical characterization capabilities of Fourier transform infrared (FTIR) spectroscopy. When the new technique is fully developed, we plan to use it to determine the molecular structure of polymer systems on a sub-micrometer scale, or about several orders of magnitude greater than currently possible using “conventional” infrared spectroscopy techniques. We are especially interested in probing the molecular structure of “interphases,” the transition regions between an adhesive and a substrate in polymer composites and adhesive bonds. We have used both contact mode AFM probes and thermal mode AFM probes to measure the response of polymer systems to infrared absorption. In either case, when the probe is engaged with a sample that is absorbing infrared radiation from the FTIR spectrometer, the output from the AFM probe resembles an interferogram to which a Fourier-transform can be applied to obtain the infrared spectrum. The contact mode approach was successfully used when various neat polymer samples, including polystyrene, polycarbonate and a model epoxy adhesive system, were characterized by AFM-FTIR techniques. Excellent spectra were also obtained from polystyrene beads having a diameter of about 2 μm. AFM thermal mode probes have been used to obtain preliminary interferograms and infrared spectra from neat polystyrene samples, but the signal-to-noise ratio was low. AFM-FTIR spectroscopy results to this point show that this new method is feasible, but the spatial resolution of the technique remains to be shown.
James Boerio, PhD (Advisor)
Jude Iroh, PhD (Committee Member)
Vesselin Shanov, PhD (Committee Member)
99 p.
Engineering; Materials Science
AFM; FTIR spectroscopy; atomic force microscopy; interphase; adhesive analysis; interferogram

Recommended Citations

Citations

  • Starr, M. J. (2008). AFM-FTIR: A New Technique for Materials Characterization [Master's thesis, University of Cincinnati]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1227192819

    APA Style (7th edition)

  • Starr, Michael. AFM-FTIR: A New Technique for Materials Characterization. 2008. University of Cincinnati, Master's thesis. OhioLINK Electronic Theses and Dissertations Center, http://rave.ohiolink.edu/etdc/view?acc_num=ucin1227192819.

    MLA Style (8th edition)

  • Starr, Michael. "AFM-FTIR: A New Technique for Materials Characterization." Master's thesis, University of Cincinnati, 2008. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1227192819

    Chicago Manual of Style (17th edition)

ucin1227192819
1,240
© 2008, all rights reserved.
This open access ETD is published by University of Cincinnati and OhioLINK.
Release 3.2.12