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Advanced Object Characterization and Monitoring Techniques Using Polarimetric Imaging

Mandadi, Bharath Kumar Reddy
http://rave.ohiolink.edu/etdc/view?acc_num=akron1243780947

Abstract Details

2009, Master of Science, University of Akron, Electrical Engineering.
The main purpose of this research study was to explore the potential application of polarimetric principles in characterization and monitoring of space materials. Space monitoring and collision avoidance between space vehicles and inter-space debris has become a major concern for space agencies and authorities maintaining satellites, space shuttles and stations. Inter-space debris can be man-made or natural. As the quantity of space debris increases, tracking and collision avoidance becomes a critical issue. The novelty of this study consists in the single pixel analysis of back scattered optical polarimetric signatures from various space materials. Surface characterization of different materials was performed by analysis of their polarization response. The study employed single-pixel detection of back scattered laser beam polarimetric signatures obtained from different materials. The back scattered optical polarimetric signatures contained major information related to geometry, texture and composition of the material. The DOLP (Degree of Linear Polarization) algorithm was applied to analyze polarization response from the different materials used in this study. Different materials used in space vehicle design were examined and the DOLP ratio was calculated at different material and detector orientations. On examining Teflon, which is a soft polymer material used in space vehicle design, we observed high depolarization of light. This was due to the “Diffuse reflectance” nature of Teflon at different object orientations. Hence, Teflon can be identified as a “Lambertian surface” exhibiting high depolarization of light. The polarization response exhibited by materials such as windowless polysilicon solar panel and a wooden stick painted in white color mixed with titanium dioxide was found to be similar to the response exhibited by Teflon. It was observed that the extent of depolarization exhibited by different materials was found to be distinct and depended on material composition. Materials such as Kapton and shiny aluminum foil exhibited sharp backscattered intensity distributions with high polarization of light at different orientations. The sharp back scattered intensity distributions of Kapton and shiny aluminum foil indicated their high polarization and “Specular reflectance” nature. Different metallic materials such as roughened aluminum, molybdenum and stainless steel were examined. It was observed that the backscattered distributions exhibited by roughened aluminum, molybdenum and stainless steel were broadened curves with distinct depolarization signatures. The depolarization exhibited by roughened aluminum was due to discontinuities present on its surface. Windowed solar panels made of amorphous silicon and polysilicon materials were tested and it was observed that both of the panels exhibited similar sharp backscattered distributions. It was observed that the amorphous silicon solar panel exhibited higher depolarization of light than the polysilicon solar panel. The experimental results indicated that single pixel polarimetric imaging can effectively sense and characterize various space materials based on the amount of optical depolarization and backscattered intensity distributions; suggesting its potential application in space research and sensing, with emphasis on the monitoring of space objects.
George Giakos, Dr. (Advisor)
143 p.
Electrical Engineering
DOLP; Deg; detector; DOLP d2; signal intensities; polarization; POLARIMETRIC

Recommended Citations

Citations

  • Mandadi, B. K. R. (2009). Advanced Object Characterization and Monitoring Techniques Using Polarimetric Imaging [Master's thesis, University of Akron]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=akron1243780947

    APA Style (7th edition)

  • Mandadi, Bharath Kumar Reddy. Advanced Object Characterization and Monitoring Techniques Using Polarimetric Imaging. 2009. University of Akron, Master's thesis. OhioLINK Electronic Theses and Dissertations Center, http://rave.ohiolink.edu/etdc/view?acc_num=akron1243780947.

    MLA Style (8th edition)

  • Mandadi, Bharath Kumar Reddy. "Advanced Object Characterization and Monitoring Techniques Using Polarimetric Imaging." Master's thesis, University of Akron, 2009. http://rave.ohiolink.edu/etdc/view?acc_num=akron1243780947

    Chicago Manual of Style (17th edition)

akron1243780947
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© 2009, all rights reserved.
This open access ETD is published by University of Akron and OhioLINK.