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Characterization of Functionalized Polymer Nanostructure Thin Films Using Angular Polarimetric Measurements

Farrahi, Tannaz
http://rave.ohiolink.edu/etdc/view?acc_num=akron1399646244

Abstract Details

2014, Master of Science in Engineering, University of Akron, Electrical Engineering.
Optical polarimetry is of paramount significance for efficient detection, discrimination, characterization and analysis of the optical properties of materials. This study introduces a novel approach of characterization of functionalized polymer nanostructures thin films, based on their optical polarization properties. By performing polarimetric angular measurements of the back scattered signals from the samples, the Stokes parameters and the Muller Matrix of the samples were estimated, using mathematical algorithms implemented by Matlab subroutines. Additional information regarding the characterization of the materials was obtained through Mueller matrix decomposition analysis. The work in this thesis was performed using the Air Force Research Laboratory (AFRL) polarimetric multifunctional imaging platform, designed in-house, for remote characterization of materials. The AFRL polarimetric system is a fully automated, auto calibrated, scalable, and reconfigurable electro-optical imaging system, consisting of a 1065 nm laser source coupled through liquid crystal (LC) polarimetric components to a single- Femtowatt photodetector operating under backscattered geometry. To achieve automation of the system, all the LC components and the femtowatt photodetector are controlled by means of a Labview developed GUI. Specifically, the polarimetric state intensities are detected by the photoreceiver and then sent to the computer via a data acquisition unit (DAQ) with a sampling frequency of 100 KHz, finally, processed using Excel and Matlab subroutines. Six set of measurements were acquired, for increased statistical accuracy, and then averaged. The outcome of this thesis indicates that polarimetric characterization of functionalized polymer nanostructures thin films may provide important discriminant signatures and figure-of-Merits (FOM)’s, leading to enhanced characterization of the materials.
George Giakos, Dr. (Advisor)
Kye-shin Lee, Dr. (Committee Member)
Arjuna Madanayake, Dr. (Committee Member)
106 p.
Electrical Engineering

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Citations

  • Farrahi, T. (2014). Characterization of Functionalized Polymer Nanostructure Thin Films Using Angular Polarimetric Measurements [Master's thesis, University of Akron]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=akron1399646244

    APA Style (7th edition)

  • Farrahi, Tannaz. Characterization of Functionalized Polymer Nanostructure Thin Films Using Angular Polarimetric Measurements . 2014. University of Akron, Master's thesis. OhioLINK Electronic Theses and Dissertations Center, http://rave.ohiolink.edu/etdc/view?acc_num=akron1399646244.

    MLA Style (8th edition)

  • Farrahi, Tannaz. "Characterization of Functionalized Polymer Nanostructure Thin Films Using Angular Polarimetric Measurements ." Master's thesis, University of Akron, 2014. http://rave.ohiolink.edu/etdc/view?acc_num=akron1399646244

    Chicago Manual of Style (17th edition)

akron1399646244
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© 2014, all rights reserved.
This open access ETD is published by University of Akron and OhioLINK.