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A Degradation-based Burn-in Optimization for Light Display Devices with Two-phase Degradation Patterns considering Warranty Durations and Measurement Errors

Gao, Yong
http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1509109739168013

Abstract Details

2017, Master of Science (MS), Ohio University, Industrial and Systems Engineering (Engineering and Technology).
This thesis proposes to plan a degradation-based burn-in test for light display devices with two-phase degradation patterns by using Bayesian approach. The main focus of the burn-in test concerned in this study is to eliminate the initial rapid degradation phase, and a hierarchical Bayesian bi-exponential model is proposed and applied to define the two-phase degradation patterns of the burn-in population. Measurement uncertainty is the main focus of the burn-in test. Measurement uncertainty is an important factor during degradation observation of the burn-in population. The expected degradation path cannot represent the same as the observed degradation path. Warranty duration can also affect the optimal burn decisions. Mission reliability and expected cost criterions are considered with the available pre-burn-in data of a plasma display panel (PDP) example. To make the optimal burn-in decision, a cost optimization (minimization) model is developed for this thesis.
Tao Yuan (Advisor)
Gary Weckman (Committee Member)
Diana Schwerha (Committee Member)
Andy Snow (Committee Member)
83 p.
Industrial Engineering
burn-in; degradation modeling; degradation-based burn-in; Gibbs sampling; hierarchical Bayesian model; Monte Carlo simulation; reliability; optimization; warranty duration; measurement errors; two-phase degradation patterns; light display devices

Recommended Citations

Citations

  • Gao, Y. (2017). A Degradation-based Burn-in Optimization for Light Display Devices with Two-phase Degradation Patterns considering Warranty Durations and Measurement Errors [Master's thesis, Ohio University]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1509109739168013

    APA Style (7th edition)

  • Gao, Yong. A Degradation-based Burn-in Optimization for Light Display Devices with Two-phase Degradation Patterns considering Warranty Durations and Measurement Errors. 2017. Ohio University, Master's thesis. OhioLINK Electronic Theses and Dissertations Center, http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1509109739168013.

    MLA Style (8th edition)

  • Gao, Yong. "A Degradation-based Burn-in Optimization for Light Display Devices with Two-phase Degradation Patterns considering Warranty Durations and Measurement Errors." Master's thesis, Ohio University, 2017. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1509109739168013

    Chicago Manual of Style (17th edition)

ohiou1509109739168013
402
© 2017, all rights reserved.
This open access ETD is published by Ohio University and OhioLINK.