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ucin1069779563.pdf (659.8 KB)
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Abstract Header
TEST PATTERN GENERATION FOR CROSSTALK FAULT IN DYNAMIC PLA
Author Info
LIU, JIANXUN
Permalink:
http://rave.ohiolink.edu/etdc/view?acc_num=ucin1069779563
Abstract Details
Year and Degree
2003, MS, University of Cincinnati, Engineering : Computer Engineering.
Abstract
Crosstalk noise is one of the major noise problems introduced by interconnect wire scaling and high clock speeds. In modern DSM circuits, Signal crosstalk can arise between two long parallel wires. The programmable logic array (PLA) has been used in modern high speed circuit design because of its predictable delay. The PLA may suffer crosstalk noise problem which arises between long and parallel product lines. It is important and necessary to identify and test those crosstalk faults. In this research, we closely observed the crosstalk effect in dynamic PLAs. Based on the characteristics of the crosstalk, we used a hierarchical approach to generate test patterns for the crosstalk fault of each product line. Final test patterns are then compressed by test pattern compressor. At last a large set of MCNC benchmark circuit is experimented to show the efficiency of the ATPG algorithm.
Committee
Wen-Ben Jone (Advisor)
Pages
91 p.
Keywords
crosstalk
;
PLA
;
product line
;
dynamic PLA
;
test pattern generation
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Citations
LIU, J. (2003).
TEST PATTERN GENERATION FOR CROSSTALK FAULT IN DYNAMIC PLA
[Master's thesis, University of Cincinnati]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1069779563
APA Style (7th edition)
LIU, JIANXUN.
TEST PATTERN GENERATION FOR CROSSTALK FAULT IN DYNAMIC PLA.
2003. University of Cincinnati, Master's thesis.
OhioLINK Electronic Theses and Dissertations Center
, http://rave.ohiolink.edu/etdc/view?acc_num=ucin1069779563.
MLA Style (8th edition)
LIU, JIANXUN. "TEST PATTERN GENERATION FOR CROSSTALK FAULT IN DYNAMIC PLA." Master's thesis, University of Cincinnati, 2003. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1069779563
Chicago Manual of Style (17th edition)
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Document number:
ucin1069779563
Download Count:
668
Copyright Info
© 2003, all rights reserved.
This open access ETD is published by University of Cincinnati and OhioLINK.