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HYPERSPECTRAL PLANNER INSTRUMENTATION FOR PRODUCT GOAL SYNTHESIS IN MATERIAL PROCESS CONTROL

JACOBS, JOHN DAVID
http://rave.ohiolink.edu/etdc/view?acc_num=ucin995300151

Abstract Details

2001, MS, University of Cincinnati, Engineering : Electrical Engineering.
Motivated by a tri-level hierarchical process control scheme developed at the Wright Patterson Air Force Base materials research laboratory, this thesis explores contemporary instrumentation methods to accommodate each level of the process control structure. The three hierarchical process levels include an environmental subprocess level, an in situ subprocess level, and an ex situ subprocess level which are linked by physical influences defining the transport of energy, mass, and momentum. A signal model hierarchy is introduced to delineate appropriate signal attributes useful for developing economical instrumentation at the corresponding control level. This model clearly demonstrates an increase in signal complexity and computational requirement with ascension from environmental to ex situ processing levels, which translates into an equivalent computational capacity required at each level of instrumentation implementation. An instrumentation taxonomy is characterized based on the requirements observed from the signal model. This structured instrumentation taxonomy defines contemporary instrumentation by application, method, and performance requirement to serve as a guide for making prudent and economical design decisions. This classification is validated by detailed design contribution examples each illustrating a level in the overall taxonomy. The resulting description lays a foundation for the design of high-performance instrumentation. This thesis concludes with a description of high-performance instrumentation for ex situ planners as applied to material process control applications. Such devices, termed analytical instruments, represent the upper-echelon of high-performance, computationally capable instrumentation as described herein. This level of instrumentation is able to realize the appropriate algorithms for product microstructural interpretation and goal-product comparisons, at the necessary bandwidth. With the use of this advanced instrumentation, it is possible for ex situ planners to be designed for optimal real-time product evaluation thus enabling automatic redirection of drifting process parameters. The term hyperspectral imaging is used to describe the versatile collateral method for integrating both spatially and spectrally continuous sensor data simultaneously to assist product characterization. The ex situ planner instrumentation utilizes this multisensor data to compute a product facsimile and update controller references based on product goal comparisons.
Dr. Patrick Garrett (Advisor)
90 p.
process control; instrumentation; hyperspectral imaging; multi-sensor integration; ex situ planners

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Citations

  • JACOBS, J. D. (2001). HYPERSPECTRAL PLANNER INSTRUMENTATION FOR PRODUCT GOAL SYNTHESIS IN MATERIAL PROCESS CONTROL [Master's thesis, University of Cincinnati]. OhioLINK Electronic Theses and Dissertations Center. http://rave.ohiolink.edu/etdc/view?acc_num=ucin995300151

    APA Style (7th edition)

  • JACOBS, JOHN. HYPERSPECTRAL PLANNER INSTRUMENTATION FOR PRODUCT GOAL SYNTHESIS IN MATERIAL PROCESS CONTROL. 2001. University of Cincinnati, Master's thesis. OhioLINK Electronic Theses and Dissertations Center, http://rave.ohiolink.edu/etdc/view?acc_num=ucin995300151.

    MLA Style (8th edition)

  • JACOBS, JOHN. "HYPERSPECTRAL PLANNER INSTRUMENTATION FOR PRODUCT GOAL SYNTHESIS IN MATERIAL PROCESS CONTROL." Master's thesis, University of Cincinnati, 2001. http://rave.ohiolink.edu/etdc/view?acc_num=ucin995300151

    Chicago Manual of Style (17th edition)

ucin995300151
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© 2001, all rights reserved.
This open access ETD is published by University of Cincinnati and OhioLINK.